Title :
Simulating open area test site emission measurements based on data obtained in a novel broadband TEM cell
Author :
Wilson, P. ; Hansen, D. ; Koenigstein, D.
Author_Institution :
ABB EMI Control Center, Baden-Daettwil, Switzerland
Abstract :
A type of electromagnetic compatibility (EMC) test chamber for both radiated emission and susceptibility measurements is discussed. The design is essentially a transverse electromagnetic cell (TEM-cell) anechoic-chamber hybrid. A steady input power generates an almost constant field (better than +/-4 dB) anywhere in the recommended test volume from DC to frequencies exceeding 1 GHz. Susceptibility testing is done as in a normal TEM cell. Emission testing models test object radiation as due to an equivalent set of multipoles (in essence electric and magnetic dipoles). The multipole components are determined through a sequence of measurements. Once found, the multipole model can be used to predict test object radiation both in an ideal free space and above a perfect ground screen. In this manner time-consuming emission measurements, such as those required by FCC Rules Part 15 Subpart J or VDE 0871, can be simulated numerically. Both experimental and theoretical measurement data are presented for a widely available personal computer
Keywords :
electromagnetic compatibility; electromagnetic interference; electromagnetic waves; test facilities; 0 to 1 GHz; DC; EMC test chamber; SHF; UHF; anechoic chamber; broadband TEM cell; constant field; device under test; electric dipoles; electromagnetic compatibility; emission testing models; ideal free space; input power; magnetic dipoles; multipole model; open area test site; perfect ground screen; personal computer; radiated emission measurement; susceptibility measurements; susceptibility testing; test object radiation; Area measurement; DC generators; Electromagnetic compatibility; Electromagnetic measurements; Frequency; Magnetic field measurement; Open area test sites; Power generation; TEM cells; Testing;
Conference_Titel :
Electromagnetic Compatibility, 1989., IEEE 1989 National Symposium on
Conference_Location :
Denver, CO
DOI :
10.1109/NSEMC.1989.37174