DocumentCode :
241789
Title :
Performance studies in nanowire field-effect transistors with different cross sections
Author :
Haoran Xuan ; Jiewen Fan ; Yuancheng Yang ; Hao Zhang ; Ming Li ; Ru Huang
Author_Institution :
Sch. of Microelectron., Peking Univ., Beijing, China
fYear :
2014
fDate :
28-31 Oct. 2014
Firstpage :
1
Lastpage :
3
Abstract :
In this work, SNWTs with three different cross sections (triangular, circular and square) are simulated by TCAD and their performance are studied. The SNWT with triangular cross section exhibits higher on/off ratio and better subthreshold characteristics compared with other transistors. In addition, an equivalent model is proposed to accurately estimate the performance of different shaped SNWTs with the same channel cross-section area to simplify the device model for future circuit simulation. All the simulation results show that the triangular prismatic SNWT is more promising for controlling SCE and be able to relax the line width limit for future low power applications.
Keywords :
field effect transistors; low-power electronics; nanoelectronics; nanowires; silicon; SCE control; TCAD; circular cross section nanowire; low power applications; nanowire field effect transistors; short channel effect; silicon nanowire field effect transistor; square cross section nanowire; triangular cross section nanowire; triangular prismatic SNWT; Abstracts; Educational institutions; Logic gates; Three-dimensional displays; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on
Conference_Location :
Guilin
Print_ISBN :
978-1-4799-3296-2
Type :
conf
DOI :
10.1109/ICSICT.2014.7021317
Filename :
7021317
Link To Document :
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