Title :
Characterization of partial discharge signals using wavelet and statistical techniques
Author :
Ming, Yu ; Birlasekaran, S.
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore
Abstract :
Study of partial discharge (PD) behavior in electrical apparatus is important to know the degradation of insulating materials. The characterization of these pulses in the form of cavity discharge, corona discharge and surface discharge is important to identify the faulty location and to quantify the degree of deterioration. A laboratory study is done by making the models of these discharges. Both time and frequency domain measurements were done. The necessary interfacing electronics to minimize the 50 Hz and harmonics from the laboratory power supply is developed. Wavelet signal processing is used to recover the PD signal by eliminating the noises of many natures. Furthermore, different wavelet filters and windowing techniques are used to improve the efficiency of PD signal extraction. With the fabricated models to create only a type of discharge, the statistical characteristic of that type of discharge is identified. A significant number of indicators are got to identify the type of discharge
Keywords :
corona; insulation testing; partial discharge measurement; power apparatus; signal processing; wavelet transforms; 50 Hz; PD signal extraction; PD signal recovery; cavity discharge; corona discharge; electrical apparatus partial discharge behavior; frequency domain measurements; insulating materials degradation; interfacing electronics; laboratory power supply; partial discharge signals characterisation; statistical techniques; surface discharge; time domain measurements; wavelet filters; wavelet techniques; windowing techniques; Corona; Degradation; Dielectrics and electrical insulation; Fault diagnosis; Fault location; Laboratories; Partial discharges; Power harmonic filters; Signal processing; Surface discharges;
Conference_Titel :
Electrical Insulation, 2002. Conference Record of the 2002 IEEE International Symposium on
Conference_Location :
Boston, MA
Print_ISBN :
0-7803-7337-5
DOI :
10.1109/ELINSL.2002.995869