DocumentCode :
2420659
Title :
Scheduling transient periods of single-armed cluster tools
Author :
Lee, Jun-Ho ; Lee, Tae-Eog
Author_Institution :
Dept. of Ind. & Syst. Eng., Korea Adv. Inst. of Sci. & Technol. (KAIST), Daejeon, South Korea
fYear :
2012
fDate :
14-18 May 2012
Firstpage :
5062
Lastpage :
5067
Abstract :
Semiconductor manufacturing fabs recently tend to reduce the lot size, that is, the number of identical wafers in a lot, because of small lot orders and increased die throughput per wafer due to wafer size increase. Therefore, cluster tools for wafer processing, which mostly repeat identical work cycles, are subject to frequent lot changes. We therefore examine scheduling problems for transient periods of single-armed cluster tools that are scheduled to repeat identical work cycles for a number of identical wafers. We first develop a Petri net model for the tool´s operational behavior including the initial transient periods as well as the steady cycles. We then develop a mixed integer programming model for finding an optimal schedule. We also examine how to adapt the simple backward sequence, which is mostly used for scheduling steady work cycles of single-armed cluster tools, for a transient period. We identify a deadlock-free condition and also propose two efficient heuristic algorithms by modifying the backward sequence. Finally, through computational experiments, we analyze the efficiency of the proposed algorithms.
Keywords :
Petri nets; integer programming; scheduling; semiconductor device manufacture; semiconductor industry; semiconductor technology; Petri net model; backward sequence; deadlock-free condition; die throughput-per-wafer; heuristic algorithms; identical wafers; mixed integer programming model; operational behavior; repeat identical work cycles; semiconductor manufacturing industry; single-armed cluster tools; transient period scheduling problems; wafer processing; wafer size; Computational modeling; Job shop scheduling; Optimal scheduling; Robots; Semiconductor device modeling; System recovery; Transient analysis; Petri nets; cluster tools; deadlock analysis; dummy wafers; scheduling; transient periods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Robotics and Automation (ICRA), 2012 IEEE International Conference on
Conference_Location :
Saint Paul, MN
ISSN :
1050-4729
Print_ISBN :
978-1-4673-1403-9
Electronic_ISBN :
1050-4729
Type :
conf
DOI :
10.1109/ICRA.2012.6225327
Filename :
6225327
Link To Document :
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