• DocumentCode
    2420697
  • Title

    A broadband low noise dual gate FET distributed amplifier

  • Author

    Thompson, William J.

  • Author_Institution
    Texas Instrum. Inc., Dallas, TX, USA
  • fYear
    1989
  • fDate
    12-13 June 1989
  • Firstpage
    11
  • Lastpage
    13
  • Abstract
    A 2 to 18 GHz monolithic GaAs low-noise distributed amplifier with 10 dB nominal gain was designed and built using the standard Texas Instrument GaAs foundry process. This process incorporates ground vias, metal-insulator-metal (MIM) capacitors and air bridges. The amplifier uses 0.5- mu m-gate ion-implanted dual-gate FETs (DGFETs). The noise figure is less than 5.7 dB over the 2 to 18 GHz band and less than 4.0 dB from 3 to 13 GHz. The DGFET amplifier provides gain control capability; with 5 V and 60 mA operating bias it provides 10-dB nominal gain, input return loss better than 10 dB, and output return loss better than 8 dB. Lower power consumption was demonstrated at 5 V and 30 mA. With this reduced bias the nominal gain drops to 8 dB and the noise figure degrades by 0.3 dB. Increasing the bias to 7 V and 90 mA increases the nominal gain to 11 dB while degrading the noise figure by 0.3 dB. This increased bias gives the amplifier medium power capability, with a 1-dB gain compression power output of 18 dBm at 18 GHz. This increases to 19 dBm for frequencies below 15 GHz.<>
  • Keywords
    III-V semiconductors; MMIC; field effect integrated circuits; gallium arsenide; microwave amplifiers; wideband amplifiers; 0.5 micron; 10 dB; 2 to 18 GHz; 30 to 90 mA; 5 to 7 V; 5.7 dB; DGFET amplifier; GaAs; MIM; SHF; air bridges; broadband amplifiers; capacitors; compression power output; dual gate FET; dual-gate FETs; gain control capability; ground vias; input return loss; ion-implanted; low noise amplifiers; low-noise distributed amplifier; medium power capability; metal-insulator-metal; noise figure; output return loss; power consumption; reduced bias; semiconductors; standard Texas Instrument GaAs foundry process; Degradation; Distributed amplifiers; FETs; Foundries; Gain; Gallium arsenide; Instruments; MIM capacitors; Metal-insulator structures; Noise figure;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave and Millimeter-Wave Monolithic Circuits Symposium, 1989. Digest of Papers., IEEE 1989
  • Conference_Location
    Long Beach, CA, USA
  • Type

    conf

  • DOI
    10.1109/MCS.1989.37252
  • Filename
    37252