Title :
Characterization of Parylene as a Water Barrier via Buried-in Pentacene Moisture Sensors for Soaking Tests
Author :
Lo, Hsi-wen ; Tai, Yu-Chong
Author_Institution :
IEEE Micromachining Lab., California Inst. of Technol., Pasadena, CA
Abstract :
We present a simple method to characterize parylene as a water barrier for soaking tests. The key component is the buried-in pentacene moisture sensor, which is a thin-film transistor sandwiched between two layers of parylene C. This pentacene thin-film transistor takes bottom contact configuration and uses parylene C as the gate dielectric material. Parylene films containing pentacene moisture sensors are soaked in saline at room temperature and the saturation drain current of pentacene thin film transistors is monitored. Hole mobility of pentacene is extracted via linearization of the square root of the drain current of the transistor versus gate voltages. We can determine the capability of parylene as a water permeation barrier by the changes of pentacene mobility.
Keywords :
humidity sensors; organic semiconductors; thin film transistors; buried-in pentacene moisture sensors; hole mobility; linearization technique; parylene characterization; pentacene mobility; pentacene thin-film transistor; soaking tests; water permeation barrier; Dielectric materials; Dielectric thin films; Moisture; Monitoring; Pentacene; Sensor phenomena and characterization; Temperature sensors; Testing; Thin film sensors; Thin film transistors; parylene; pentacene; thin-film transistor;
Conference_Titel :
Nano/Micro Engineered and Molecular Systems, 2007. NEMS '07. 2nd IEEE International Conference on
Conference_Location :
Bangkok
Print_ISBN :
1-4244-0610-2
DOI :
10.1109/NEMS.2007.352156