DocumentCode
2421053
Title
Characterization of Parylene as a Water Barrier via Buried-in Pentacene Moisture Sensors for Soaking Tests
Author
Lo, Hsi-wen ; Tai, Yu-Chong
Author_Institution
IEEE Micromachining Lab., California Inst. of Technol., Pasadena, CA
fYear
2007
fDate
16-19 Jan. 2007
Firstpage
872
Lastpage
875
Abstract
We present a simple method to characterize parylene as a water barrier for soaking tests. The key component is the buried-in pentacene moisture sensor, which is a thin-film transistor sandwiched between two layers of parylene C. This pentacene thin-film transistor takes bottom contact configuration and uses parylene C as the gate dielectric material. Parylene films containing pentacene moisture sensors are soaked in saline at room temperature and the saturation drain current of pentacene thin film transistors is monitored. Hole mobility of pentacene is extracted via linearization of the square root of the drain current of the transistor versus gate voltages. We can determine the capability of parylene as a water permeation barrier by the changes of pentacene mobility.
Keywords
humidity sensors; organic semiconductors; thin film transistors; buried-in pentacene moisture sensors; hole mobility; linearization technique; parylene characterization; pentacene mobility; pentacene thin-film transistor; soaking tests; water permeation barrier; Dielectric materials; Dielectric thin films; Moisture; Monitoring; Pentacene; Sensor phenomena and characterization; Temperature sensors; Testing; Thin film sensors; Thin film transistors; parylene; pentacene; thin-film transistor;
fLanguage
English
Publisher
ieee
Conference_Titel
Nano/Micro Engineered and Molecular Systems, 2007. NEMS '07. 2nd IEEE International Conference on
Conference_Location
Bangkok
Print_ISBN
1-4244-0610-2
Type
conf
DOI
10.1109/NEMS.2007.352156
Filename
4160459
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