• DocumentCode
    2421053
  • Title

    Characterization of Parylene as a Water Barrier via Buried-in Pentacene Moisture Sensors for Soaking Tests

  • Author

    Lo, Hsi-wen ; Tai, Yu-Chong

  • Author_Institution
    IEEE Micromachining Lab., California Inst. of Technol., Pasadena, CA
  • fYear
    2007
  • fDate
    16-19 Jan. 2007
  • Firstpage
    872
  • Lastpage
    875
  • Abstract
    We present a simple method to characterize parylene as a water barrier for soaking tests. The key component is the buried-in pentacene moisture sensor, which is a thin-film transistor sandwiched between two layers of parylene C. This pentacene thin-film transistor takes bottom contact configuration and uses parylene C as the gate dielectric material. Parylene films containing pentacene moisture sensors are soaked in saline at room temperature and the saturation drain current of pentacene thin film transistors is monitored. Hole mobility of pentacene is extracted via linearization of the square root of the drain current of the transistor versus gate voltages. We can determine the capability of parylene as a water permeation barrier by the changes of pentacene mobility.
  • Keywords
    humidity sensors; organic semiconductors; thin film transistors; buried-in pentacene moisture sensors; hole mobility; linearization technique; parylene characterization; pentacene mobility; pentacene thin-film transistor; soaking tests; water permeation barrier; Dielectric materials; Dielectric thin films; Moisture; Monitoring; Pentacene; Sensor phenomena and characterization; Temperature sensors; Testing; Thin film sensors; Thin film transistors; parylene; pentacene; thin-film transistor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems, 2007. NEMS '07. 2nd IEEE International Conference on
  • Conference_Location
    Bangkok
  • Print_ISBN
    1-4244-0610-2
  • Type

    conf

  • DOI
    10.1109/NEMS.2007.352156
  • Filename
    4160459