• DocumentCode
    2422571
  • Title

    The use of HALT to improve computer reliability for point-of-sale equipment

  • Author

    Gusciora, Robert H.

  • Author_Institution
    Ultimate Technol. Corp., Victor, NY, USA
  • fYear
    1998
  • fDate
    19-22 Jan 1998
  • Firstpage
    89
  • Lastpage
    93
  • Abstract
    This paper describes a manufacturer´s use of HALT (highly accelerated life test) to help identify the root causes of multiple, intermittent, and complex problems with certain personal computers (PCs) as used in point-of-sale (POS) equipment. In addition to identifying the root causes of “forced” hardware problems by means of these special and severe environmental tests, the paper describes attempts to understand the relationships between the test failures and the experienced factory and field problems. Although the tested PCs have been primarily used in point-of-sale equipment, their hardware is very similar to that of ordinary PCs, so the paper´s results are applicable to the average PC user. The paper has three basic conclusions: (1) single-sided board construction, while inexpensive, is not suitable for the very high reliability required by POS applications; (2) tin-plated connectors are not reliable for use in POS equipment, especially for low-force, low-current applications like SIMMS cards; and (3) HALT served as a useful tool for identifying some of the perplexing sources of factory and field problems with PCs. Note that the second conclusion is also applicable to those not in the POS market: (a) tin platings are probably not suitable for certain connectors in home and office PCs; and (b) the data provides a rare example where an accelerated test has quickly demonstrated tin-plated connectors to be troublesome, in situ, in complex electronic systems
  • Keywords
    electric connectors; environmental testing; fault tolerant computing; life testing; microcomputer applications; microcomputers; point of sale systems; reliability; HALT; SIMMS cards; complex electronic systems; computer reliability improvement; environmental tests; factory problems; field problems; forced hardware problems; highly accelerated life test; personal computers; point-of-sale equipment; single-sided board construction; test failures; tin-plated connectors; very high reliability; Computer aided manufacturing; Connectors; Hardware; Life estimation; Life testing; Microcomputers; Personal communication networks; Production facilities; Pulp manufacturing; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 1998. Proceedings., Annual
  • Conference_Location
    Anaheim, CA
  • ISSN
    0149-144X
  • Print_ISBN
    0-7803-4362-X
  • Type

    conf

  • DOI
    10.1109/RAMS.1998.653597
  • Filename
    653597