2423592

2002 IEEE Radiation Effects Data Workshop. Workshop Record (Cat. No.02TH8631)

2002

15-19 July 2002

analogue integrated circuits; digital integrated circuits; electronic equipment testing; environmental degradation; integrated circuit reliability; integrated circuit testing; optoelectronic devices; radiation effects; semiconductor device reliability; semiconductor device testing; space vehicle electronics; test facilities; analog component testing; combined environments; commercial components; digital component testing; environment studies; optoelectronic devices; photonic devices; radiation damage; radiation effects; radiation testing facilities; single-event effects; spacecraft systems; testbed experiments; total ionizing dose response;

English

ieee

Radiation Effects Data Workshop, 2002 IEEE

Phoenix, AZ, USA

0-7803-7544-0

conf

10.1109/REDW.2002.1045523

1045523