Title :
Current single event effects and radiation damage results for candidate spacecraft electronics
Author :
O´Bryan, Martha V. ; LaBel, Kenneth A. ; Ladbury, Ray L. ; Poivey, Christian ; Howard, James W., Jr. ; Reed, Robert A. ; Kniffin, Scott D. ; Buchner, Stephen P. ; Bings, John P. ; Titus, Jeff L. ; Clark, Steven D. ; Turflinger, Thomas L. ; Seidleck, Chris
Author_Institution :
Raytheon Inf. Technol. & Sci. Services, Lanham, MD, USA
Abstract :
We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects, proton-induced damage, and total ionizing dose. Devices tested include optoelectronics, digital, analog, linear bipolar, hybrid devices, analog-to-digital converters (ADCs), digital-to-analog converters (DACs), and DC-DC converters, among others.
Keywords :
aerospace testing; electronic equipment testing; integrated circuit reliability; integrated circuit testing; optical testing; radiation hardening (electronics); semiconductor device reliability; semiconductor device testing; space vehicle electronics; ADC; DAC; DC-DC converters; analog devices; analog-to-digital converters; candidate spacecraft electronics vulnerability; current single event effects testing; digital IC; digital-to-analog converters; hybrid devices; linear bipolar devices; optoelectronics; proton-induced damage; proton/heavy ion induced single event effects; radiation damage testing; total ionizing dose; Aerospace electronics; Analog-digital conversion; Cyclotrons; NASA; Protons; Single event upset; Space technology; Space vehicles; Telephony; Testing;
Conference_Titel :
Radiation Effects Data Workshop, 2002 IEEE
Print_ISBN :
0-7803-7544-0
DOI :
10.1109/REDW.2002.1045537
