Title :
A ballistic model for the understanding of insulators behaviour during electron irradiation
Author :
Dutriez, C. ; Meyza, X. ; Guerret-Piecourt, C. ; Tréheux, D. ; Fitting, H.J.
Author_Institution :
Ecole Centrale de Lyon, Ecully, France
Abstract :
One of the limiting factor to use materials as high voltage insulator is the dielectric breakdown: this phenomenon is induced by the destabilization of charges injected and trapped in the sample. To characterize this space charge, we develop a model of electrical charges displacements and trapping in a sample irradiated by an electron beam. On the one hand, we use an experimental method called ICM Induced Current Method. During the irradiation by an e-beam, the variations of the sample holder current are collected. They are very sensitive to the spreading and charging mechanisms. On the other hand, we adapt the one-dimensional self-consistent ballistic method to the case of a bulk insulator. Then the charging up of irradiated specimen is simulated. This model is a performing tool to the understanding of mechanisms that controls the behaviour of a material under continuous electron irradiation. Particularly, it underlines the major effect of the surface potential on the slowing down process of impinging electrons energy in case of negative charging (electron emission yield lower than 1). First results on polycrystalline alumina and polymers are presented and compared.
Keywords :
alumina; ballistic transport; ceramic insulation; electric breakdown; electron beam effects; organic insulating materials; polymers; space charge; surface potential; Al2O3; Induced Current Method; ballistic model; bulk insulator; charging mechanisms; dielectric breakdown; electrical charges displacements; electrical charges trapping; electron irradiation; impinging electrons energy; insulators behaviour; negative charging; one-dimensional self-consistent ballistic method; polycrystalline alumina; polymers; sample holder current; slowing down process; space charge; spreading mechanisms; surface potential; Breakdown voltage; Dielectric breakdown; Dielectric materials; Dielectrics and electrical insulation; Electron beams; Electron emission; Electron traps; Polymers; Space charge; Surface charging;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2003. Annual Report. Conference on
Print_ISBN :
0-7803-7910-1
DOI :
10.1109/CEIDP.2003.1254909