Title :
Automatic generation of symmetric transparent March memory tests
Author :
Yarmolik, V.N. ; Sokol, B.
Abstract :
High-density memories are often used in safety-critical microelectronic systems. Transparent March algorithms allow realizing periodic testing of memory while preserving its contents. This paper presents the novel technique of automatic symmetric transparent algorithms generation. It is based on selecting fault detection and hiding conditions and analysis of fault manifestation map.
Keywords :
automatic test pattern generation; built-in self test; deterministic algorithms; fault simulation; integrated circuit testing; random-access storage; March sequence; automatic generation; deterministic memory BIST; fault detection conditions; fault hiding conditions; fault manifestation map; fault models; high-density memories; symmetric transparent March memory tests; symmetry breaks; transparent March algorithms; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Random access memory; Read-write memory; System testing; Writing;
Conference_Titel :
CAD Systems in Microelectronics, 2003. CADSM 2003. Proceedings of the 7th International Conference. The Experience of Designing and Application of
Print_ISBN :
966-553-278-2
DOI :
10.1109/CADSM.2003.1255041
