DocumentCode
242844
Title
Measurement based chip impedance determination on validation board
Author
Gowrish, B. ; Basu, Anirban
Author_Institution
Data Commun. Div., Cypress Semicond. Tech. India Pvt. Ltd., Bangalore, India
fYear
2014
fDate
22-25 Oct. 2014
Firstpage
1
Lastpage
4
Abstract
In this paper, a simple and robust methodology for chip impedance determination by de-embedding transition is proposed and described. The methodology is solely based on measurement with no dependency on 3D Electro-Magnetic simulator. The proposed method has been verified by measuring chip impedance of a radio operating at 2.45 GHz. The measured chip impedance from the proposed methodology matches reasonably close to the simulated impedance obtained from chip designer for most practical applications. The impedance error in the proposed measurement based methodology is within 15 %, with magnitude error being 13.7 % and phase error of 12.2 %.
Keywords
integrated circuit design; radiofrequency integrated circuits; 3D electromagnetic simulator; chip impedance determination; deembedding transition; frequency 2.45 GHz; validation board; Antenna measurements; Impedance; Impedance measurement; Integrated circuits; Measurement uncertainty; Semiconductor device measurement; Wireless communication; Chip impedance; de-embedding; scattering parameter (S parameter); vector network analyzer (VNA);
fLanguage
English
Publisher
ieee
Conference_Titel
TENCON 2014 - 2014 IEEE Region 10 Conference
Conference_Location
Bangkok
ISSN
2159-3442
Print_ISBN
978-1-4799-4076-9
Type
conf
DOI
10.1109/TENCON.2014.7021867
Filename
7021867
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