DocumentCode :
242844
Title :
Measurement based chip impedance determination on validation board
Author :
Gowrish, B. ; Basu, Anirban
Author_Institution :
Data Commun. Div., Cypress Semicond. Tech. India Pvt. Ltd., Bangalore, India
fYear :
2014
fDate :
22-25 Oct. 2014
Firstpage :
1
Lastpage :
4
Abstract :
In this paper, a simple and robust methodology for chip impedance determination by de-embedding transition is proposed and described. The methodology is solely based on measurement with no dependency on 3D Electro-Magnetic simulator. The proposed method has been verified by measuring chip impedance of a radio operating at 2.45 GHz. The measured chip impedance from the proposed methodology matches reasonably close to the simulated impedance obtained from chip designer for most practical applications. The impedance error in the proposed measurement based methodology is within 15 %, with magnitude error being 13.7 % and phase error of 12.2 %.
Keywords :
integrated circuit design; radiofrequency integrated circuits; 3D electromagnetic simulator; chip impedance determination; deembedding transition; frequency 2.45 GHz; validation board; Antenna measurements; Impedance; Impedance measurement; Integrated circuits; Measurement uncertainty; Semiconductor device measurement; Wireless communication; Chip impedance; de-embedding; scattering parameter (S parameter); vector network analyzer (VNA);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
TENCON 2014 - 2014 IEEE Region 10 Conference
Conference_Location :
Bangkok
ISSN :
2159-3442
Print_ISBN :
978-1-4799-4076-9
Type :
conf
DOI :
10.1109/TENCON.2014.7021867
Filename :
7021867
Link To Document :
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