• DocumentCode
    242844
  • Title

    Measurement based chip impedance determination on validation board

  • Author

    Gowrish, B. ; Basu, Anirban

  • Author_Institution
    Data Commun. Div., Cypress Semicond. Tech. India Pvt. Ltd., Bangalore, India
  • fYear
    2014
  • fDate
    22-25 Oct. 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, a simple and robust methodology for chip impedance determination by de-embedding transition is proposed and described. The methodology is solely based on measurement with no dependency on 3D Electro-Magnetic simulator. The proposed method has been verified by measuring chip impedance of a radio operating at 2.45 GHz. The measured chip impedance from the proposed methodology matches reasonably close to the simulated impedance obtained from chip designer for most practical applications. The impedance error in the proposed measurement based methodology is within 15 %, with magnitude error being 13.7 % and phase error of 12.2 %.
  • Keywords
    integrated circuit design; radiofrequency integrated circuits; 3D electromagnetic simulator; chip impedance determination; deembedding transition; frequency 2.45 GHz; validation board; Antenna measurements; Impedance; Impedance measurement; Integrated circuits; Measurement uncertainty; Semiconductor device measurement; Wireless communication; Chip impedance; de-embedding; scattering parameter (S parameter); vector network analyzer (VNA);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    TENCON 2014 - 2014 IEEE Region 10 Conference
  • Conference_Location
    Bangkok
  • ISSN
    2159-3442
  • Print_ISBN
    978-1-4799-4076-9
  • Type

    conf

  • DOI
    10.1109/TENCON.2014.7021867
  • Filename
    7021867