Title :
Binary distribution system reliability optimization model considering substation bus schemes and feeder devices
Author :
Tarnate, Wilbert Rey D. ; Cruz, Ivan Benedict Nilo C.
Author_Institution :
Electr. & Electron. Eng. Inst., Univ. of the Philippines - Diliman, Quezon City, Philippines
Abstract :
Bus schemes used in distribution substations affect the reliability of distribution systems. Existing reliability optimization methodologies give sub-optimal combinations of bus schemes and feeder device locations since these methodologies separately optimize the 1) substation bus schemes and 2) feeder device locations. A binary programming model is proposed in this paper to combine the two subproblems and find the optimal combination of bus schemes and feeder device locations. The proposed model quantifies reliability using SAIFI, SAIDI, ASIFI, and ASIDI. Also, the model utilizes failure-modes-and-effects analysis (FMEA) to consider component outages in the subtransmission system, substations, and distribution feeders. Sample optimization cases highlight the impact of combining the two sub-problems into a single optimization problem.
Keywords :
optimisation; power distribution reliability; substations; ASIDI; ASIFI; FMEA; SAIDI; SAIFI; binary distribution system reliability optimization model; binary programming model; bus schemes; distribution feeders; distribution substations; failure-modes-and-effects analysis; feeder device locations; feeder devices; substation bus schemes; subtransmission system; Decision support systems; Silicon; bus schemes; distribution system reliability; reliability optimization; substation;
Conference_Titel :
TENCON 2014 - 2014 IEEE Region 10 Conference
Conference_Location :
Bangkok
Print_ISBN :
978-1-4799-4076-9
DOI :
10.1109/TENCON.2014.7022367