• DocumentCode
    2431229
  • Title

    Atomistic simulation of quantum dots including strain and bandstructure and full band simulation of hole transport in 1-D heterostructures

  • Author

    Klimeck, G. ; Bowen, R.C. ; Boykin, T.B.

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • fYear
    2000
  • fDate
    22-25 May 2000
  • Firstpage
    6
  • Lastpage
    7
  • Abstract
    As microelectronic research moves devices to nanometer scale operating at GHz speeds, the physics of electron flow through devices becomes more complicated and physical effects, which previously could be ignored safely in microelectronic devices, become significant. High energy electron injection, quantization of charge, quantization of energy, and electron scattering interactions are some of the phenomena that are presently being investigated experimentally and theoretically. Raytheon/TI developed a 1-D quantum device simulator (NEMO-1D) to address such issues. That effort combined expertise in device physics, numerical and graphical user interface technologies to produce the first quantitative, general-purpose quantum device simulator. The work presented here is an extension of the of the NEMO 1-D software to massively parallel high performance computing to enable the simulation of hole transport and to 3-D modeling to enable quantum dot simulations.
  • Keywords
    semiconductor heterojunctions; semiconductor quantum dots; 1D heterostructure; 3D model; NEMO 1D software; atomistic simulation; band structure; full-band simulation; hole transport; massively parallel computing; quantum device simulator; quantum dot; strain; Capacitive sensors; Computational modeling; Electrons; Graphical user interfaces; Microelectronics; Nanoscale devices; Particle scattering; Physics; Quantization; Quantum dots;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Electronics, 2000. Book of Abstracts. IWCE Glasgow 2000. 7th International Workshop on
  • Conference_Location
    Glasgow, UK
  • Print_ISBN
    0-85261-704-6
  • Type

    conf

  • DOI
    10.1109/IWCE.2000.869893
  • Filename
    869893