• DocumentCode
    2431595
  • Title

    Impurity photovoltaic effect in crystalline silicon solar cells

  • Author

    Kasai, Hiroto ; Sat, Toshiyuki ; Matsumura, Hideki

  • Author_Institution
    Adv. Inst. of Sci. & Technol., Ishikawa, Japan
  • fYear
    1997
  • fDate
    29 Sep-3 Oct 1997
  • Firstpage
    215
  • Lastpage
    218
  • Abstract
    For effect of impurity traps for efficiency improvement of solar cells (called impurity photovoltaic effect) has been investigated by measuring optical absorption and characteristics of crystalline silicon solar cells. Energy level and spatial position of the impurity traps, and compensation of charges caused by the traps are definite requirements to improve the cell efficiency by the IPV effect under suppression of carrier recombination. Indium is selected as one of the proper impurities that satisfy these requirements in crystalline silicon. For indium introduced crystalline silicon solar cell, it is possible to increase the photocurrent without degrading the values of open circuit voltage. It is concluded that the IPV effect is useful to improve the cell efficiency
  • Keywords
    electron-hole recombination; elemental semiconductors; impurities; indium; photoconductivity; photovoltaic effects; silicon; solar cells; Si:In; carrier recombination suppression; characteristics measurement; charges compensation; crystalline silicon solar cells; efficiency improvement; energy level; impurity photovoltaic effect; impurity traps; impurity traps spatial position; indium; open circuit voltage; optical absorption measurement; photocurrent increase; Absorption; Charge carrier processes; Crystallization; Energy states; Impurities; Indium; Photoconductivity; Photovoltaic cells; Photovoltaic effects; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-3767-0
  • Type

    conf

  • DOI
    10.1109/PVSC.1997.654067
  • Filename
    654067