• DocumentCode
    2431685
  • Title

    Monte Carlo modeling of wurtzite and 4H phase semiconductor materials

  • Author

    Brennan, K.F. ; Bellotti, E. ; Farahmand, M. ; Nilsson, H.-E. ; Ruden, P.P. ; Zhang, Y.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Tech., Atlanta, GA, USA
  • fYear
    2000
  • fDate
    22-25 May 2000
  • Firstpage
    51
  • Lastpage
    52
  • Abstract
    We present a discussion of the complexities encountered in particle simulation models for noncubic symmetry materials, focusing on the wurtzite and 4H phases of semiconductors. We have identified three general issues, band structure, scattering mechanisms, and band intersections, which in our opinion, constitute the most important modifications to Monte Carlo simulators for cubic symmetry materials. Owing to the increased number of atoms and size of the unit cell, the band structure is far more complex in wurtzite and 4H polytypes than in zincblende phase semiconductors. This added complexity is reflected by the greater number of bands, smaller Brillouin zone and concomitant increase in the number of band intersections. We have found that the band intersection points greatly influence the transport dynamics. In this paper, we discuss our initial attempts at treating transport near these points.
  • Keywords
    Brillouin zones; Monte Carlo methods; band structure; electrical conductivity; semiconductor materials; 4H phase; Brillouin zone; Monte Carlo model; band intersection point; band structure; electron transport; noncubic symmetry; particle simulation; scattering mechanism; semiconductor material; unit cell; wurtzite phase; Brillouin scattering; Computational modeling; Computer simulation; Electrons; Information technology; Ionization; Monte Carlo methods; Particle scattering; Semiconductor materials; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Electronics, 2000. Book of Abstracts. IWCE Glasgow 2000. 7th International Workshop on
  • Conference_Location
    Glasgow, UK
  • Print_ISBN
    0-85261-704-6
  • Type

    conf

  • DOI
    10.1109/IWCE.2000.869917
  • Filename
    869917