• DocumentCode
    2431912
  • Title

    A Network-on-Chip monitoring infrastructure for communication-centric debug of embedded multi-processor SoCs

  • Author

    Vermeulen, Bart ; Goossens, Kees

  • Author_Institution
    NXP Semicond. Res., Eindhoven, Netherlands
  • fYear
    2009
  • fDate
    28-30 April 2009
  • Firstpage
    183
  • Lastpage
    186
  • Abstract
    Problems in a new System on Chip (SOC) consisting of hardware and embedded software often only show up when a silicon prototype of the chip is placed in its intended target environment and the application is executed. Traditionally, the debugging of embedded systems is difficult and time consuming because of the intrinsic lack of internal system observability and controlability in the target environment. Design for Debug (DfD) is the act of adding debug support to the design of a chip, in the realization that not every SOC is correct first time. DfD provides debug engineers with increased observability and controlability of the internal operation of an embedded system. In this paper, we present a monitoring infrastructure for multi-processor SOCs with a Network on Chip (NOC), and explain its application to performance analysis and debug. We describe how our monitors aid in the performance analysis and debug of the interactions of the embedded processors. We present a generic template for bus and router monitors, and show how they are instantiated at design time in our NOC design flow. We conclude this paper with details of their hardware cost.
  • Keywords
    embedded systems; microprocessor chips; network-on-chip; system-on-chip; SoC; communication-centric debug; debug engineers; design for debug; embedded multi-processor; network-on-chip monitoring infrastructure; system on chip; Control systems; Design for disassembly; Embedded software; Embedded system; Hardware; Monitoring; Network-on-a-chip; Observability; Performance analysis; System-on-a-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, Automation and Test, 2009. VLSI-DAT '09. International Symposium on
  • Conference_Location
    Hsinchu
  • Print_ISBN
    978-1-4244-2781-9
  • Electronic_ISBN
    978-1-4244-2782-6
  • Type

    conf

  • DOI
    10.1109/VDAT.2009.5158125
  • Filename
    5158125