DocumentCode
2432905
Title
Thin film CdS/CdTe solar cells prepared by electrodeposition using low cost materials
Author
Alvarez, F.J. ; Lalla, N. Di ; Lamagna, A.
Author_Institution
Dept. of Phys., CNEA, Buenos Aires, Argentina
fYear
1997
fDate
29 Sep-3 Oct 1997
Firstpage
459
Lastpage
462
Abstract
This article describes the elaboration process of thin films for CdS/CdTe solar cells using low cost materials and a very simple process. The device structure (SnO2:F/CdS/CdTe/Cu/Au) is deposited on coverglass substrates. The crystal structure of the films were determined by X-ray diffraction analysis. The surface morphology and microstructure of both films were subsequently characterized using a conventional scanning electron microscopy (SEM) and an atomic force microscopy (AFM). An enlargement of the grain size structure is observed after the thermal annealing. Finally, the solar cells prepared using this process exhibited a short circuit current density of Jsc=18 mA/cm2, open circuit voltage of Voc =600 mV and efficiencies above 5% under AM 1 simulated solar illumination
Keywords
II-VI semiconductors; X-ray diffraction; annealing; atomic force microscopy; cadmium compounds; crystal morphology; electrodeposits; grain size; scanning electron microscopy; semiconductor thin films; short-circuit currents; solar cells; 600 mV; AM 1 simulated solar illumination; CdS-CdTe; SnO2:F-CdS-CdTe-Cu-Au; SnO2:F/CdS/CdTe/Cu/Au solar cell structure; X-ray diffraction analysis; atomic force microscopy; coverglass substrates; crystal structure; electrodeposition; grain size structure enlargement; low cost materials; microstructure; open circuit voltage; scanning electron microscopy; short circuit current density; surface morphology; thermal annealing; thin film CdS/CdTe solar cells; Atomic force microscopy; Costs; Crystal microstructure; Crystalline materials; Gold; Grain size; Photovoltaic cells; Scanning electron microscopy; Substrates; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE
Conference_Location
Anaheim, CA
ISSN
0160-8371
Print_ISBN
0-7803-3767-0
Type
conf
DOI
10.1109/PVSC.1997.654127
Filename
654127
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