Title :
Pareto-optimal radar waveform design
Author :
De Maio, A. ; Piezzo, M. ; Farina, A. ; Wicks, M.
Author_Institution :
Dipt. di Ing. Biomed., Elettron. e delle Telecomun., Univ. degli Studi di Napoli Federico II, Naples, Italy
Abstract :
This paper deals with the problem of Pareto-optimal waveform design in the presence of colored Gaussian noise, under a similarity and an energy constraint. At the design stage, we determine the optimal radar code according to the following criterion: joint constrained maximization of the detection probability and constrained minimization of the Cramer Rao Lower Bound (CRLB) on the Doppler estimation accuracy. This is tantamount to jointly maximizing two quadratic forms under two quadratic constraints, so that the problem can be formulated in terms of a non-convex multi-objective optimization problem. In order to solve it, we resort to the scalarization technique, which reduces the vectorial problem into a scalar one using a Pareto weight defining the relative importance of the two objective functions. At the analysis stage, we assess the performance of the proposed waveform design scheme in terms of detection performance and region of achievable Doppler estimation accuracy. In particular, we analyze the role of the Pareto weight in the optimization process.
Keywords :
Doppler radar; Gaussian noise; Pareto optimisation; concave programming; estimation theory; radar detection; radar theory; CRLB; Cramer Rao lower bound; Doppler estimation accuracy; Pareto weight; Pareto-optimal radar waveform design; Pareto-optimal waveform design; colored Gaussian noise; constrained minimization; detection performance; detection probability; joint constrained maximization; nonconvex multiobjective optimization problem; optimal radar code; optimization process; quadratic constraints; quadratic forms; scalarization technique; vectorial problem; waveform design scheme; Accuracy; Doppler effect; Doppler radar; Estimation; Optimization; Radar detection;
Conference_Titel :
Waveform Diversity and Design Conference (WDD), 2010 International
Conference_Location :
Niagara Falls, ON
Print_ISBN :
978-1-4244-8202-3
DOI :
10.1109/WDD.2010.5592547