DocumentCode :
2434178
Title :
Assembly test chips and circuits for detecting and measuring mechanical damage in packaged ICs
Author :
Sweet, James N.
Author_Institution :
Adv. Packaging Dept., Sandia Nat. Labs., Albuquerque, NM, USA
fYear :
1994
fDate :
16-19 Oct 1994
Firstpage :
30
Lastpage :
36
Abstract :
Die cracking and stress induced damage to metal conductors in plastic package integrated circuits have become major reliability issues in recent times. Test chips with structures which can detect cracking or metal damage can be used to qualify new types of packaging. The Sandia stress sensing chip, ATC04, can make quantitative measurements of in-plane shearing stress which can in turn be related to the shearing stresses which produce metal motion. Recent stress measurements with liquid encapsulated ATC04 parts are reviewed and accuracy limits discussed. Other types of test chips attempt to detect thin film cracking or delamination by electrical detection of damage to conductor structures in or near chip corners. Several designs of such chips are discussed
Keywords :
cracks; delamination; failure analysis; integrated circuit manufacture; integrated circuit packaging; integrated circuit reliability; life testing; plastic packaging; production testing; ATC04; Sandia stress sensing chip; assembly test chips; conductor structures; delamination; die cracking; in-plane shearing stress; liquid encapsulated parts; mechanical damage; packaged ICs; plastic package; reliability issues; stress induced damage; Assembly; Circuit testing; Conductors; Integrated circuit measurements; Integrated circuit packaging; Integrated circuit reliability; Plastic integrated circuit packaging; Semiconductor device measurement; Shearing; Stress measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Reliability Workshop, 1994. Final Report., 1994 International
Conference_Location :
Lake Tahoe, CA
Print_ISBN :
0-7803-1908-7
Type :
conf
DOI :
10.1109/IRWS.1994.515823
Filename :
515823
Link To Document :
بازگشت