Title :
Automated system for multifrequency measurement of the far field pattern
Author :
Zverev, A.K. ; Vishnevetsky, A.S. ; Fedotov, A.N.
Author_Institution :
ARGUS-RPh Ltd., St. Petersburg, Russia
Abstract :
The description of the automated stand for measurements of multi-frequency far-field antenna pattern is given. The stand is based on standard microwave instrumentation and modern computing methods. The stand can realize pattern measurement at 200 frequencies simultaneously for one rotational displacement of the tested antenna with a speed up to 5 angular points per second.
Keywords :
antenna radiation patterns; automatic test equipment; microwave antennas; microwave measurement; angular points; automated system; far field pattern; multi-frequency far-field antenna pattern; multifrequency measurement; pattern measurement; rotational displacement; standard microwave instrumentation; tested antenna; Assembly; Microwave antenna arrays; Microwave technology; Organizing;
Conference_Titel :
Microwave Conference, 2000. Microwave and Telecommunication Technology. 2000 10th International Crimean
Conference_Location :
Crimea, Ukraine
Print_ISBN :
966-572-048-1
DOI :
10.1109/CRMICO.2000.1256206
