• DocumentCode
    2435263
  • Title

    InGaAs monolithic interconnected modules (MIMs)

  • Author

    Fatemi, Navid S. ; Wilt, David M. ; Jenkins, Phillip P. ; Weizer, Victor G. ; Hoffman, Richard W., Jr. ; Murray, Christopher S. ; Scheiman, David ; Brinker, David ; Riley, David

  • Author_Institution
    Essential Res. Inc., Cleveland, OH, USA
  • fYear
    1997
  • fDate
    29 Sep-3 Oct 1997
  • Firstpage
    799
  • Lastpage
    804
  • Abstract
    A monolithic interconnected module (MIM) structure has been developed for thermophotovoltaic (TPV) applications. The MIM device consists of many individual InGaAs cells series-connected on a single semi-insulating InP substrate. An infrared (IR) back surface reflector (BSR), placed on the rear surface of the substrate, returns the unused portion of the TPV radiator output spectrum back to the radiator for recuperation, thereby providing for high system efficiencies. Also, the use of a BSR reduces the requirements imposed on a front surface interference filter and may lead to using only an anti-reflection coating. As a result, MIMs are exposed to the entire radiator output, and with increasing output power density. MIMs were fabricated with an active area of 0.9×1 cm, and with 15 cells monolithically connected in series. Both lattice-matched and lattice-mismatched InGaAs/InP devices were fabricated, with bandgaps of 0.74 and 0.55 eV, respectively. The 0.74 eV MIMs demonstrated an open-circuit voltage (Voc) of 6.16 V and a fill factor of 74.2% at a short-circuit current (Jsc) of 0.84 A/cm2, under flashlamp testing. The 0.55 eV modules demonstrated a Voc of 4.85 V and a fill factor of 57.8% at a Jsc of 3.87 A/cm2. The near IR reflectance (2-4 μm) for both lattice-matched and lattice-mismatched structures was measured to be in the range of 80-85%. Latest electrical and optical performance results for these MIMs is presented
  • Keywords
    II-VI semiconductors; III-V semiconductors; gallium arsenide; indium compounds; photovoltaic cells; semiconductor device testing; 0.55 eV; 0.74 eV; 0.9 cm; 1 cm; 2 to 4 mum; 4.85 V; 6.16 V; IR back surface reflector; InGaAs-InP; InGaAs/InP thermophotovoltaic cells; active area; anti-reflection coating; bandgaps; electrical performance; fill factor; monolithic interconnected modules; open-circuit voltage; optical performance; output power density; short-circuit current; thermophotovoltaics; Coatings; Filters; Indium gallium arsenide; Indium phosphide; Infrared spectra; Interference; MIM devices; Photonic band gap; Power generation; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-3767-0
  • Type

    conf

  • DOI
    10.1109/PVSC.1997.654209
  • Filename
    654209