DocumentCode
2435263
Title
InGaAs monolithic interconnected modules (MIMs)
Author
Fatemi, Navid S. ; Wilt, David M. ; Jenkins, Phillip P. ; Weizer, Victor G. ; Hoffman, Richard W., Jr. ; Murray, Christopher S. ; Scheiman, David ; Brinker, David ; Riley, David
Author_Institution
Essential Res. Inc., Cleveland, OH, USA
fYear
1997
fDate
29 Sep-3 Oct 1997
Firstpage
799
Lastpage
804
Abstract
A monolithic interconnected module (MIM) structure has been developed for thermophotovoltaic (TPV) applications. The MIM device consists of many individual InGaAs cells series-connected on a single semi-insulating InP substrate. An infrared (IR) back surface reflector (BSR), placed on the rear surface of the substrate, returns the unused portion of the TPV radiator output spectrum back to the radiator for recuperation, thereby providing for high system efficiencies. Also, the use of a BSR reduces the requirements imposed on a front surface interference filter and may lead to using only an anti-reflection coating. As a result, MIMs are exposed to the entire radiator output, and with increasing output power density. MIMs were fabricated with an active area of 0.9×1 cm, and with 15 cells monolithically connected in series. Both lattice-matched and lattice-mismatched InGaAs/InP devices were fabricated, with bandgaps of 0.74 and 0.55 eV, respectively. The 0.74 eV MIMs demonstrated an open-circuit voltage (Voc) of 6.16 V and a fill factor of 74.2% at a short-circuit current (Jsc) of 0.84 A/cm2, under flashlamp testing. The 0.55 eV modules demonstrated a Voc of 4.85 V and a fill factor of 57.8% at a Jsc of 3.87 A/cm2. The near IR reflectance (2-4 μm) for both lattice-matched and lattice-mismatched structures was measured to be in the range of 80-85%. Latest electrical and optical performance results for these MIMs is presented
Keywords
II-VI semiconductors; III-V semiconductors; gallium arsenide; indium compounds; photovoltaic cells; semiconductor device testing; 0.55 eV; 0.74 eV; 0.9 cm; 1 cm; 2 to 4 mum; 4.85 V; 6.16 V; IR back surface reflector; InGaAs-InP; InGaAs/InP thermophotovoltaic cells; active area; anti-reflection coating; bandgaps; electrical performance; fill factor; monolithic interconnected modules; open-circuit voltage; optical performance; output power density; short-circuit current; thermophotovoltaics; Coatings; Filters; Indium gallium arsenide; Indium phosphide; Infrared spectra; Interference; MIM devices; Photonic band gap; Power generation; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE
Conference_Location
Anaheim, CA
ISSN
0160-8371
Print_ISBN
0-7803-3767-0
Type
conf
DOI
10.1109/PVSC.1997.654209
Filename
654209
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