DocumentCode
2435306
Title
Influence of diamond additions on lead-free Sn-Zn-Bi solder-alloys
Author
Qin, Pei ; Hu, Xiao ; Chan, Y C
Author_Institution
Department of Electronic Engineering, City University of Hong Kong, Hong Kong
fYear
2012
fDate
17-20 Sept. 2012
Firstpage
1
Lastpage
4
Abstract
In this work, diamond nano-particles doped Sn-8Zn-3Bi solder alloys have been studied. The microstructure and the interfacial reactions of the plain solder joints and solder joints containing diamond nano-particles were investigated under current density of 5×103 A/cm2 at temperature of 100°C with Cu pads on daisy chain type ball grid array (BGA) substrates. It was found diamond nano-particles doped in solder joints refined the microstructure and retarded the formation of Cu5 Zn8 intermetallic compounds (IMCs). The shear strength of solder joints containing diamond nano-particles exhibited higher value than that of plain solder joint. In addition, the fracture surface of doped solder joints appeared ductile behavior with very rough dimpled surfaces. DSC analyses of plain and doped solders revealed the onset and melting temperatures of solder alloys with diamond additions kept nearly unchanged, indicating its potentially viable applications and benefits.
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic System-Integration Technology Conference (ESTC), 2012 4th
Conference_Location
Amsterdam, Netherlands
Print_ISBN
978-1-4673-4645-0
Type
conf
DOI
10.1109/ESTC.2012.6542091
Filename
6542091
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