• DocumentCode
    2437882
  • Title

    Design optimization of sense amplifiers using deeply-scaled FinFET devices

  • Author

    Shafaei, Alireza ; Yanzhi Wang ; Petraglia, Antonio ; Pedram, Massoud

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Southern California, Los Angeles, CA, USA
  • fYear
    2015
  • fDate
    2-4 March 2015
  • Firstpage
    280
  • Lastpage
    283
  • Abstract
    This paper presents the design optimization of sense amplifiers made of deeply-scaled (7nm) FinFET devices in order to improve the energy efficiency of cache memories, while robust operation of the sense amplifier under process variations is achieved. To this end, an analytical solution for deriving the minimum voltage difference that can be correctly sensed between the sense amplifier inputs, considering process variations, is presented. Device parameters and transistor sizing of the sense amplifier are then optimized in order to further increase the cache energy efficiency. The optimized sense amplifier design has 2-fold lower input voltage difference compared with the baseline counterpart, which according to the architecture-level simulations, causes 26% reduction in the total energy consumption of an L1 cache memory.
  • Keywords
    MOSFET circuits; amplifiers; cache storage; circuit optimisation; energy conservation; 2-fold lower input voltage difference; L1 cache memory; architecture-level simulations; cache energy efficiency; cache memories; deeply-scaled FinFET devices; device parameters; process variations; sense amplifier design optimization; size 7 nm; transistor sizing; Energy consumption; FinFETs; Flyback transformers; Logic gates; Mathematical model; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2015 16th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • Print_ISBN
    978-1-4799-7580-8
  • Type

    conf

  • DOI
    10.1109/ISQED.2015.7085439
  • Filename
    7085439