DocumentCode
2437882
Title
Design optimization of sense amplifiers using deeply-scaled FinFET devices
Author
Shafaei, Alireza ; Yanzhi Wang ; Petraglia, Antonio ; Pedram, Massoud
Author_Institution
Dept. of Electr. Eng., Univ. of Southern California, Los Angeles, CA, USA
fYear
2015
fDate
2-4 March 2015
Firstpage
280
Lastpage
283
Abstract
This paper presents the design optimization of sense amplifiers made of deeply-scaled (7nm) FinFET devices in order to improve the energy efficiency of cache memories, while robust operation of the sense amplifier under process variations is achieved. To this end, an analytical solution for deriving the minimum voltage difference that can be correctly sensed between the sense amplifier inputs, considering process variations, is presented. Device parameters and transistor sizing of the sense amplifier are then optimized in order to further increase the cache energy efficiency. The optimized sense amplifier design has 2-fold lower input voltage difference compared with the baseline counterpart, which according to the architecture-level simulations, causes 26% reduction in the total energy consumption of an L1 cache memory.
Keywords
MOSFET circuits; amplifiers; cache storage; circuit optimisation; energy conservation; 2-fold lower input voltage difference; L1 cache memory; architecture-level simulations; cache energy efficiency; cache memories; deeply-scaled FinFET devices; device parameters; process variations; sense amplifier design optimization; size 7 nm; transistor sizing; Energy consumption; FinFETs; Flyback transformers; Logic gates; Mathematical model; Robustness;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design (ISQED), 2015 16th International Symposium on
Conference_Location
Santa Clara, CA
Print_ISBN
978-1-4799-7580-8
Type
conf
DOI
10.1109/ISQED.2015.7085439
Filename
7085439
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