Title :
Impact of negative bias temperature instability on product parametric drift
Author :
Reddy, Vijay ; Carulli, John ; Krishnan, Anand ; Bosch, William ; Burgess, Brendan
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
Abstract :
A systematic test methodology is presented that comprehends the impact of negative bias temperature instability on product parametric drift. In specific NBTI degradation mechanisms in digital CMOS circuits and transistors are presented. A test guard-banding technique to estimate parameter drift under BI and customer use conditions is also given.
Keywords :
CMOS digital integrated circuits; MOSFET; integrated circuit reliability; semiconductor device reliability; thermal stability; degradation mechanisms; digital CMOS circuits; negative bias temperature instability; parameter drift estimation; product parametric drift; test guard banding technique; transistors; CMOS digital integrated circuits; Circuit testing; Degradation; Integrated circuit testing; MOSFETs; Negative bias temperature instability; Niobium compounds; System testing; Titanium compounds; Voltage;
Conference_Titel :
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN :
0-7803-8580-2
DOI :
10.1109/TEST.2004.1386947
