DocumentCode :
2438351
Title :
Digital testing and reliability education (DTRE) computer tool
Author :
Kubatova, Hana ; Jelinek, Radek
Author_Institution :
Dept. of Comput. Sci. & Eng., Czech Tech. Univ., Praha, Czech Republic
Volume :
3
fYear :
2002
fDate :
2002
Firstpage :
1227
Abstract :
This paper describes our computer tool for the educational course "Diagnostics and Reliability". It consists of three programs and a web presentation. It serves for education, practical lessons and exercises but not for replacing it. The web presentation contains theoretical parts of each topic, user manuals, examples and programs for experiments to perform. The simple JeL language based on Boolean equations can describe the structure of a tested circuit. The TEST program generates the complete structural detection test set. The pseudo-random test can be generated by the HILDO program and next the test fault coverage can be studied and a fault dictionary can be created. The RELIABILITY program computes basic reliability characteristics from a graphical block model. The brief description of the JeL language, these three programs and the structure of our Digital Testing and Reliability Education (DTRE) tool are presented.
Keywords :
circuit reliability; circuit testing; computer aided instruction; digital circuits; educational courses; electronic engineering computing; electronic engineering education; fault diagnosis; logic testing; Boolean equations; DTRE computer tool; HILDO program; JeL language; RELIABILITY program; TEST program; Web presentation; diagnostics/reliability course; digital testing education; engineering education; fault dictionary creation; graphical block model; pseudo-random test generation; reliability characteristics; reliability education; structural detection test set; test fault coverage; Circuit faults; Circuit testing; Computer science; Computer science education; Design for testability; Educational programs; Equations; Natural languages; Reliability engineering; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics, Circuits and Systems, 2002. 9th International Conference on
Print_ISBN :
0-7803-7596-3
Type :
conf
DOI :
10.1109/ICECS.2002.1046475
Filename :
1046475
Link To Document :
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