Title :
Domain studies in single-crystal ferrite MIG heads with image-enhanced, wide-field, Kerr microscopy
Author :
Scafer, R. ; Argyle, B.E. ; Trouilloud, P.L.
Author_Institution :
Thomas J. Watson Research Center
Keywords :
Chemicals; Coercive force; Etching; Ferrites; Magnetic domains; Magnetic films; Magnetic heads; Microscopy; Stress; Surface treatment;
Conference_Titel :
Magnetics Conference, 1992. Digests of Intermag '92., International
Conference_Location :
St. Louis, MO, USA
Print_ISBN :
0-7803-0637-6
DOI :
10.1109/INTMAG.1992.696404