Title :
Automatic frequency control for maximizing RF power fed to ultrasonic transducer operating at 1 MHz
Author :
Mizutani, Yoko ; Suzuki, Taiju ; Ikeda, Hiroaki ; Yoshida, Hirofumi
Author_Institution :
Shizuoka Univ., Hamamatsu, Japan
Abstract :
For driving an ultrasonic transducer for cleaning semiconductor wafers or other industrial materials, the ultrasonic transducer having an input power of 60 W and operating at 1 MHz is driven from a prototype of the DC-to-RF inverter with an automatic frequency tuning function. Though the automatic frequency tuning circuit using a PLL circuit is not easy to build since the ultrasonic transducer has a complicated frequency dependent impedance, the RF power fed to the load can be maximized by a new type of PLL tuning circuit even if the resonating frequency of the ultrasonic transducer changes due to change of the load impedance. The ultrasonic transducer has a pole at 1 MHz. The frequency range of a VCO was designed to cover 0.8 MHz to 1.2 MHz so that the resonating frequency of the ultrasonic transducer was set at 1 MHz which was the center frequency of the VCO output. The operation of the system for feeding an RF power of 60 W to the ultrasonic transducer at 1 MHz was satisfactory
Keywords :
acoustic transducers; automatic frequency control; electric impedance; invertors; phase locked loops; ultrasonic transducers; voltage-controlled oscillators; 1 MHz; 60 W; DC-to-RF inverter; PLL circuit; RF power maximisation; VCO frequency range; automatic frequency control; automatic frequency tuning function; frequency dependent impedance; industrial materials cleaning; load impedance; resonating frequency; semiconductor wafers cleaning; ultrasonic transducer operation; Automatic frequency control; Circuit optimization; Cleaning; Impedance; Phase locked loops; Radio frequency; Resonant frequency; Semiconductor materials; Ultrasonic transducers; Voltage-controlled oscillators;
Conference_Titel :
Industry Applications Conference, 1996. Thirty-First IAS Annual Meeting, IAS '96., Conference Record of the 1996 IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-3544-9
DOI :
10.1109/IAS.1996.559279