• DocumentCode
    2438865
  • Title

    Nanosecond imaging of relativistic electron transport in a paraxial diode gas cell

  • Author

    Bittlestone, D. ; Cooper, G. ; McLean, J.

  • Author_Institution
    AWE, Reading
  • fYear
    2008
  • fDate
    15-19 June 2008
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    The paraxial diode is routinely fielded on a number of AWE pulsed-power accelerators to provide a flash X-ray source for use in radiography experiments. In these diodes, a relativistic 30-40 kA electron beam is created in a vacuum diode gap, passed through a thin anode foil, and then transported, in air at 1.1 Torr, to a high-Z metal target, producing Bremsstrahlung radiation. At present, this diode does not meet AWE´s future X-ray source requirement of >1000 R@lm in a <2 mm spot. In order to achieve this, a program of research has commenced to improve the understanding of the diode´s operation. One of the factors believed to significantly affect the diode´s operation is the focusing behaviour of the electron beam within the gas-filled transport region of the diode. LSP (Large Scale Plasma) PiC simulations have suggested that the electron beam´s focal position moves axially within the gas cell throughout the duration of the pulse. This movement is believed to significantly increase the time-integrated spot size produced by the diode. In an attempt to verify this behaviour, 10 ns images of the light emission generated by the electron beam´s propagation within the gas cell have been taken at different stages of the 80 ns pulse, produced by one of AWE´s 5MV Superswarf accelerators. These presented images show that the beam pinches rapidly as the current rises, after which the beam appears to remain tightly pinched.
  • Keywords
    bremsstrahlung; cells (electric); electron accelerators; electron beam focusing; pinch effect; plasma diodes; plasma focus; plasma simulation; plasma transport processes; AWE pulsed-power accelerators; AWE´s Superswarf accelerators; Bremsstrahlung radiation; beam pinches; current 30 kA to 40 kA; flash X-ray source; focusing property; gas-filled transport; high-Z metal target; large scale plasma PiC simulations; nanosecond imaging; paraxial diode gas cell; pressure 1.1 torr; radiography; relativistic electron transport; thin anode foil; time-integrated spot size; vacuum diode gap; Anodes; Diodes; Electron beams; Focusing; Large-scale systems; Optical imaging; Plasma simulation; Plasma transport processes; Radiography; X-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2008. ICOPS 2008. IEEE 35th International Conference on
  • Conference_Location
    Karlsruhe
  • ISSN
    0730-9244
  • Print_ISBN
    978-1-4244-1929-6
  • Electronic_ISBN
    0730-9244
  • Type

    conf

  • DOI
    10.1109/PLASMA.2008.4590867
  • Filename
    4590867