Title :
Microchip design for Josephson-array in epitaxial structures Nb//spl alpha/-Al/sub 2/O/sub 3/
Author_Institution :
D.I. Mendeleyev Inst. for Metrol., St. Petersburg, Russia
Abstract :
Summary form only given, as follows.In this paper the ways for improving the voltage standard based on the Josephson effect are reported. Problems concerning the reproducibility of the Josephson long-lived voltage steps in the circuits to be used in the voltage standards and other applications are considered. This problem is minimized by a new microchip design based on the hetero-epitaxial structure Nb on sapphire.
Keywords :
Josephson effect; measurement standards; niobium; sapphire; superconducting epitaxial layers; voltage measurement; Josephson effect; Josephson-array; Nb-Al/sub 2/O/sub 3/; Nb//spl alpha/-Al/sub 2/O/sub 3/; epitaxial structures; hetero-epitaxial structure; microchip design; reproducibility; sapphire; voltage standard; voltage standards; voltage steps; Capacitive sensors; Josephson effect; Josephson junctions; Metrology; Microwave antenna arrays; Niobium; Superconducting films; Temperature distribution; US Department of Transportation; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1996 Conference on
Conference_Location :
Braunschweig, Germany
Print_ISBN :
0-7803-3376-4
DOI :
10.1109/CPEM.1996.547038
