• DocumentCode
    2441019
  • Title

    Precise measurement of the accuracy of 24 bit ADC by AC Josephson effect

  • Author

    Yoshida, H. ; Kozakai, T. ; Yada, E. ; Murayama, Y.

  • Author_Institution
    Advantest Labs. Ltd., Miyagi, Japan
  • fYear
    1996
  • fDate
    17-21 June 1996
  • Firstpage
    226
  • Lastpage
    227
  • Abstract
    This paper reports precise measurement of the offset error voltage and non-linearity error voltage of 24 bit analog to digital converter (ADC) from -10 V to +10 V on the basis of 10-V Josephson junction array voltage standard system (10-V JJAVS). Characteristics of the ADC have improved with correction of detected localized raggedness of those errors.
  • Keywords
    Josephson effect; analogue-digital conversion; characteristics measurement; integrated circuit measurement; measurement standards; superconducting junction devices; voltage measurement; -10 to 10 V; 24 bit; AC Josephson effect; ADC; JJAVS; Josephson junction array; analog to digital converter; localized raggedness; nonlinearity error voltage; offset error voltage; voltage standard system; Electrical resistance measurement; Error correction; Josephson effect; Laboratories; Linearity; Millimeter wave measurements; Programmable control; Pulse measurements; Pulse width modulation; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements Digest, 1996 Conference on
  • Conference_Location
    Braunschweig, Germany
  • Print_ISBN
    0-7803-3376-4
  • Type

    conf

  • DOI
    10.1109/CPEM.1996.547043
  • Filename
    547043