DocumentCode :
2442468
Title :
Author index
fYear :
2000
fDate :
22-24 May 2000
Firstpage :
172
Lastpage :
172
Abstract :
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Process-Induced Damage, 2000 5th International Symposium on
Conference_Location :
Santa Clara, CA, USA
Print_ISBN :
0-9651577-4-1
Type :
conf
DOI :
10.1109/PPID.2000.870672
Filename :
870672
Link To Document :
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