• DocumentCode
    2444696
  • Title

    LEON 3FT Processor Radiation Effects Data

  • Author

    Hafer, C. ; Griffith, S. ; Guertin, S. ; Nagy, J. ; Sievert, F. ; Gaisler, J. ; Habinc, S.

  • Author_Institution
    Aeroflex Colorado Springs, Colorado Springs, CO, USA
  • fYear
    2009
  • fDate
    20-24 July 2009
  • Firstpage
    148
  • Lastpage
    151
  • Abstract
    Special SEU test software is used to monitor the single-bit per word corrected errors in the internal SRAM of the LEON 3 fault tolerant processor. SEL and TID results are discussed.
  • Keywords
    SRAM chips; fault tolerance; program processors; radiation effects; LEON 3FT processor radiation effects; SEL; SEU test software; TID; fault tolerant processor; internal SRAM; single event latchup; single-bit per word corrected errors; total ionizing dose; Fault tolerance; Monitoring; Protection; Radiation effects; Random access memory; Registers; Single event upset; Springs; Telephony; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2009 IEEE
  • Conference_Location
    Quebec City, QC
  • Print_ISBN
    978-1-4244-5092-3
  • Type

    conf

  • DOI
    10.1109/REDW.2009.5336299
  • Filename
    5336299
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2444696