Title :
Verification of MMIC on-wafer microstrip TRL calibration
Author :
Woodin, C. ; Goff, M.
Author_Institution :
Lockheed Sanders Inc., Nashua, NH, USA
Abstract :
An on-wafer calibration verification technique is presented. The approach involves comparing thru-reflect-line (TRL) calibrated microstrip measurements with independent resonator measurements in the 1.0- to 26.5-GHz band. This is believed to be the first reported independent verification of any microstrip on-wafer calibration. The improved accuracy using a verified on-wafer microstrip TRL calibration is demonstrated to improve the ability to attain first-iteration MMIC (monolithic microwave integrated circuit) design success.<>
Keywords :
MMIC; calibration; integrated circuit testing; microwave measurement; strip lines; 1 to 26.5 GHz; MMIC design; MMIC on-wafer microstrip TRL calibration; microstrip on-wafer calibration; resonator measurements; thru-reflect-line; Calibration; Circuits; Couplings; MMICs; Microstrip resonators; Microwave measurements; Microwave technology; Microwave theory and techniques; Phase measurement; Transmission line measurements;
Conference_Titel :
Microwave Symposium Digest, 1990., IEEE MTT-S International
Conference_Location :
Dallas, TX
DOI :
10.1109/MWSYM.1990.99755
