DocumentCode
2446599
Title
Effect of Nickel Film Thickness on the Attenuation of SAW
Author
Yoshida, Hajime ; Lee, Guo-Tai ; Xu, Mu Liang ; Levy, Moises
fYear
1981
fDate
14-16 Oct. 1981
Firstpage
479
Lastpage
482
Keywords
Attenuation; Delay lines; Magnetic field measurement; Magnetic fields; Magnetic films; Nickel; Optical films; Piezoelectric films; Substrates; Surface acoustic waves;
fLanguage
English
Publisher
ieee
Conference_Titel
1981 Ultrasonics Symposium
Conference_Location
Chicago, IL, USA
Type
conf
DOI
10.1109/ULTSYM.1981.197667
Filename
1534607
Link To Document