• DocumentCode
    2448451
  • Title

    Behavioral modeling of current controled inverters for large signal analysis

  • Author

    Valdivia, V. ; Lázaro, A. ; Barrado, A. ; Sanz, M. ; Raga, C. ; Fernández, C.

  • Author_Institution
    Power Electron. Syst. Group, Univ. Carlos III of Madrid, Leganes
  • fYear
    2008
  • fDate
    10-13 Nov. 2008
  • Firstpage
    590
  • Lastpage
    595
  • Abstract
    In last years, the number of power systems with multiple converters and loads is increasing. Simulation tools are usually needed in order to carry out the analysis of the stability and the large signal response of these power systems. When the power systems are composed of commercial converters whose internal structure is unknown, the use of behavioral models is necessary in order to carry out the simulations. That kind of models can be characterized by means of manufacturer datasheets and/or experimental measurements, carried out over the converters. Therefore, a detailed knowledge of the converter internal structure is not necessary. In this paper a new behavioral modeling of current controlled inverters is presented. The proposed approach allows modeling the large signal response of the converter. The required simulation time is optimized and the characterization procedure is easy, due to the model simplicity.
  • Keywords
    invertors; network analysis; power convertors; power system simulation; power system stability; behavioral modelling; current controlled inverters; current modelling; large signal analysis; power system stability; Analytical models; Industrial power systems; Inverters; Power system analysis computing; Power system measurements; Power system modeling; Power system simulation; Power system stability; Signal analysis; Stability analysis; Behavioral model; Converter modeling; current controlled; grid connected; inverter; large signal; three phase;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1553-572X
  • Print_ISBN
    978-1-4244-1767-4
  • Electronic_ISBN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2008.4758020
  • Filename
    4758020