DocumentCode
2448564
Title
Behavioral Dependency Measurement for Change-Proneness Prediction in UML 2.0 Design Models
Author
Han, Ah-Rim ; Jeon, Sang-Uk ; Bae, Doo-Hwan ; Hong, Jang-Eui
Author_Institution
Dept. of Comput. Sci., Korea Adv. Inst. of Sci. & Technol., Seoul
fYear
2008
fDate
July 28 2008-Aug. 1 2008
Firstpage
76
Lastpage
83
Abstract
During the development and maintenance of object-oriented (OO) software, the information on the classes which are more prone to be changed is very useful. Developers and maintainers can make a more flexible software by modifying the part of classes which are sensitive to changes. Traditionally, most change-proneness prediction has been studied based on source codes. However, change-proneness prediction in the early phase of software development can provide an easier way for developing a stable software by modifying the current design or choosing alternative designs before implementation. To address this need, we present a systematic method for calculating the behavioral dependency measure (BDM) which helps to predict change-proneness in UML 2.0 models. The proposed measure has been evaluated on a multi-version medium size open-source project namely JFreeChart. The obtained results show that the BDM is an useful indicator and can be complementary to existing OO metrics for change-proneness prediction.
Keywords
Unified Modeling Language; object-oriented programming; software engineering; source coding; JFreeChart; UML 2.0 design models; behavioral dependency measurement; change-proneness prediction; flexible software; multi-version medium size open-source project; object-oriented software; source codes; Application software; Computer applications; Open loop systems; Open source software; Predictive models; Programming; Software debugging; Software maintenance; Software quality; Unified modeling language; Behavioral dependency measurement; Change-proneness; UML models;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Software and Applications, 2008. COMPSAC '08. 32nd Annual IEEE International
Conference_Location
Turku
ISSN
0730-3157
Print_ISBN
978-0-7695-3262-2
Electronic_ISBN
0730-3157
Type
conf
DOI
10.1109/COMPSAC.2008.80
Filename
4591537
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