Correlation between surface carbon concentration and adhesive strength at the Si cell/EVA interface in a PV module

Author

Dhere, Neelkanth G. ; Wollam, Mark E. ; Gadre, Kaustubh S.

Author_Institution

Solar Energy Center, Cape Canaveral, FL, USA

fYear

1997

fDate

29 Sep-3 Oct 1997

Firstpage

1217

Lastpage

1220

Abstract

Silicon solar cell/EVA composite is being studied with an objective to further improve the manufacturing technology of PV modules. Sample extraction and an adhesion strength measurement process has been modified. Silicon and EVA samples were extracted from solar cells of new and field-deployed modules. Optical microscopy, SEM, and AES of samples from new modules revealed EVA islands covering most of the silicon cell surface indicating a cohesive failure. A good correlation was observed between the adhesive strength and surface concentration of carbon. A low carbon concentration which indicated less EVA clinging to cell surface always resulted in low adhesive strengths. The correlation provides a simple technique for inferring properties of EVA

Keywords

Auger effect; elemental semiconductors; encapsulation; optical microscopy; polymers; scanning electron microscopy; silicon; solar cell arrays; solar cells; AES; C; EVA islands; PV module; SEM; Si; Si cell/EVA interface; adhesive strength; cohesive failure; field-deployed modules; manufacturing technology; optical microscopy; silicon solar cell/EVA composite; surface carbon concentration; Adhesive strength; Costs; Crystallization; Manufacturing; Optical microscopy; Photovoltaic cells; Qualifications; Scanning electron microscopy; Silicon; Torque;

fLanguage

English

Publisher

ieee

Conference_Titel

Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE

Conference_Location

Anaheim, CA

ISSN

0160-8371

Print_ISBN

0-7803-3767-0

Type

conf

DOI

10.1109/PVSC.1997.654308

Filename

654308