Title :
Simulation requirements for vectors in ATE formats
Author_Institution :
Texas Instrum. Ltd., Bangalore, India
Abstract :
The simulation of test vectors in ATE formats is shown to facilitate diagnosis and prevention of failures at the ATE. This work discusses the requirements for a simulation-based flow to validate the test vectors before being handed out to the ATE engineers. The experiences of running such a flow, developed based on this methodology, is also briefly described.
Keywords :
automatic test equipment; built-in self test; failure analysis; integrated circuit testing; ATE formats; BIST; failure diagnosis; failure prevention; test vector simulation; Automatic test pattern generation; Automatic testing; Circuit testing; Costs; Instruments; Switches; System testing; Test equipment; Test pattern generators; Time to market;
Conference_Titel :
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN :
0-7803-8580-2
DOI :
10.1109/TEST.2004.1387384
