Application and validation of a new PV performance characterization method

Author

Whitaker, Charles M. ; Townsend, Timothy U. ; Newmiller, Jeffrey D. ; King, David L. ; Boyson, William E. ; Kratochvil, Jay A. ; Collier, David E. ; Osborn, Donald E.

Author_Institution

Endecon Eng., San Ramon, CA, USA

fYear

1997

fDate

29 Sep-3 Oct 1997

Firstpage

1253

Lastpage

1256

Abstract

Rating a PV system is complicated by the difficulties of obtaining performance data under the “rating” conditions, the intricate relationships between PV output and prevailing conditions, and the desire for quick results at low cost. Since 1989, PVUSA has been rating PV systems using continuous data collection and a simple regression model. Sandia National Laboratories has developed an improved IV curve-based method for characterizing PV arrays. Several systems at the PVUSA facility in Davis, CA were subjected to both methods. The results of that work are presented in this paper

Keywords

photovoltaic power systems; solar cell arrays; statistical analysis; IV curve-based method; PV performance characterization method; PV system rating; PVUSA; Sandia National Laboratories; continuous data collection; performance data; prevailing conditions; regression model; Costs; Data engineering; Delay systems; Electric resistance; Equations; Laboratories; System testing; Temperature dependence; Voltage; Wind speed;

fLanguage

English

Publisher

ieee

Conference_Titel

Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE

Conference_Location

Anaheim, CA

ISSN

0160-8371

Print_ISBN

0-7803-3767-0

Type

conf

DOI

10.1109/PVSC.1997.654315

Filename

654315