Title :
The photorefractive reflection gratings recording in bismuth titanium oxide crystals
Author :
Ageyev, E.Yu. ; Shandarov, S.M. ; Veretennikov, S.Yu. ; Yanov, A. G Mart ; Kartashov, V.A.
Author_Institution :
Tomsk State Univ. of Control Syst. & Radioelectronics, Russia
Abstract :
Photorefractive crystals are an interesting matter class due to the possible application of their photorefractive properties in optical data processing and phase conjugation of light beams as well as in holographic interferometry and optical sensors. We studied an undoped Bi 12TiO20 (BTO) crystal grown from high-temperature melt. A typical feature of BTO crystals is a considerable light-induced absorption at λ = 633 nm that may lead to noticeable changes in the dynamics of two-beam coupling as well as in its steady-state value. We investigated the dynamics of two-beam coupling on a reflection grating and of light-induced absorption. The (100) cut BTO sample with optically polished (100) faces had thickness d = 3.46 mm and specific optical rotation p = -6.5° mm-1
Keywords :
bismuth compounds; holographic gratings; holographic storage; light absorption; optical phase conjugation; optical rotation; photorefractive effect; 3.46 mm; 633 nm; Bi12TiO20; light-induced absorption; optical rotation; photorefractive reflection gratings recording; two-beam coupling; Bismuth; Gratings; Holographic optical components; Holography; Optical interferometry; Optical recording; Optical reflection; Optical sensors; Photorefractive effect; Photorefractive materials;
Conference_Titel :
Electron Devices and Materials, 2002. SIBEDEM 2002. The IEEE-Siberian Conference on
Conference_Location :
Tomsk
Print_ISBN :
0-7803-7274-3
DOI :
10.1109/SIBEDM.2002.998056
