DocumentCode :
2451584
Title :
Unequally Valued Emitter Ballasting Resistors Optimum Design of Multi-finger Power GeSi HBTs
Author :
Jianjun, Qiu ; Wanrong, Zhang ; Dongyue, Jin ; Jingwei, Yang ; Pan, Gao ; Ying, Liu
Author_Institution :
Sch. of Electron. Inf. & Control Eng., Beijing Univ. of Technol., Beijing
fYear :
2006
fDate :
26-29 Oct. 2006
Firstpage :
1
Lastpage :
4
Abstract :
Multi-finger structure is commonly used in microwave power GeSi HBTs (heterojunction bipolar transistors). Usually equally valued emitter ballasting resistors are added to improve thermal stability of the devices. However, self-heating and thermal coupling effects make the temperature distribution on emitter fingers non-uniform, so the equally valued ballasting resistors structure is not optimum. In this paper, an unequally valued ballasting resistors structure is presented, which could improve the uniformity of devices´ temperature distribution effectively, and decrease the highest temperature to a certain extent.
Keywords :
Ge-Si alloys; heterojunction bipolar transistors; microwave power transistors; resistors; semiconductor materials; thermal stability; GeSi; emitter; heterojunction bipolar transistors; microwave power transistors; multifinger power GeSi HBT; self-heating effect; temperature distribution; thermal coupling effect; thermal stability; unequally valued ballasting resistors; Electronic ballasts; Fingers; Germanium silicon alloys; Heterojunction bipolar transistors; Microwave devices; Resistors; Silicon germanium; Temperature distribution; Thermal resistance; Thermal stability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas, Propagation & EM Theory, 2006. ISAPE '06. 7th International Symposium on
Conference_Location :
Guilin
Print_ISBN :
1-4244-0162-3
Electronic_ISBN :
1-4244-0163-1
Type :
conf
DOI :
10.1109/ISAPE.2006.353246
Filename :
4168287
Link To Document :
بازگشت