• DocumentCode
    245199
  • Title

    Automatic mura inspection using the principal component analysis for the TFT-LCD panel

  • Author

    Jim-Woo Yun ; Heon Gu ; Kim, Dae-hwan ; Hoi-Sik Moon ; Sung-Jea Ko

  • Author_Institution
    Sch. of Electr. Eng., Korea Univ., Seoul, South Korea
  • fYear
    2014
  • fDate
    26-28 May 2014
  • Firstpage
    109
  • Lastpage
    110
  • Abstract
    In this paper, we propose a principal component analysis (PCA)-based mura detection algorithm. Recent conventional algorithms divide the panel image with the detection window and detect the mura in each detection window. However, these algorithms have several problems due to the limitation of the detection window size. To overcome these problems, we first estimate the background image of the entire panel image by applying the PCA method. And then, the difference image between the input panel image and the estimated background image is used for the mura region decision. The experimental results show that the proposed algorithm outperforms the conventional mura detection algorithm.
  • Keywords
    automatic testing; liquid crystal displays; principal component analysis; thin film transistors; TFT-LCD panel; automatic mura inspection; background image; detection window size; estimated background image; input panel image; mura region decision; principal component analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Consumer Electronics - Taiwan (ICCE-TW), 2014 IEEE International Conference on
  • Conference_Location
    Taipei
  • Type

    conf

  • DOI
    10.1109/ICCE-TW.2014.6904008
  • Filename
    6904008