DocumentCode
2452045
Title
Loading effects in resistance scaling
Author
Elmquist, R.E. ; Dziuba, R.F.
Author_Institution
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fYear
1996
fDate
17-21 June 1996
Firstpage
334
Lastpage
335
Abstract
Power loading effects in dc resistance references are not well understood even for the most commonly used high precision standards. This paper examines loading effects and their contribution to the uncertainty of recent NIST comparisons of the quantum Hall effect and calculable capacitor.
Keywords
electric resistance measurement; measurement errors; measurement standards; quantum Hall effect; resistors; NIST comparisons; calculable capacitor; dc resistance references; high precision standards; power loading effects; quantum Hall effect; resistor; scaling measurements; transfer standards; uncertainty; Current measurement; Electric resistance; Electrical resistance measurement; Measurement standards; NIST; Power measurement; Resistors; Temperature distribution; Temperature measurement; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 1996 Conference on
Conference_Location
Braunschweig, Germany
Print_ISBN
0-7803-3376-4
Type
conf
DOI
10.1109/CPEM.1996.547101
Filename
547101
Link To Document