• DocumentCode
    245229
  • Title

    An 8b extremely area efficient threshold configuring SAR ADC with source voltage shifting technique

  • Author

    Yoshioka, Kazuaki ; Shikata, Akira ; Sekimoto, Ryota ; Kuroda, Tadahiro ; Ishikuro, Hiroki

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Keio Univ., Yokohama, Japan
  • fYear
    2014
  • fDate
    20-23 Jan. 2014
  • Firstpage
    31
  • Lastpage
    32
  • Abstract
    An extremely low power and area efficient threshold configuring ADC (TC-ADC) for time interleaved ADC is proposed. The threshold configuring comparator (TCC) performs a binary search. 5b conversion is carried out by TCC with source voltage shifting technique. Additional 2b resolution is achieved by the proposed threshold interpolation (TI) technique with only 15% power overhead. Prototype ADC in 40nm CMOS occupies a core area of only 0.0038mm2 and when calibration circuit included, 0.0058 mm2. With a supply voltage of 0.7V, the ADC achieves 7.0 ENOB with 24MS/s. Peak FoM of 9.8fJ/conv. is obtained at 0.5V supply, which is over 15x improvement compared with conventional TC-ADC.
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; comparators (circuits); interpolation; low-power electronics; CMOS techonology; SAR ADC; TCC; calibration circuit; extremely area efficient threshold; size 40 nm; source voltage shifting technique; successive approximation register; threshold configuring comparator; threshold interpolation; time interleaved ADC; voltage 0.5 V; voltage 0.7 V; CMOS integrated circuits; Calibration; Indium phosphide; Interpolation; Threshold voltage; Transistors; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (ASP-DAC), 2014 19th Asia and South Pacific
  • Conference_Location
    Singapore
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2014.6742859
  • Filename
    6742859