• DocumentCode
    245287
  • Title

    Fixing Double Patterning violations with look-ahead

  • Author

    Bhattacharya, Surya ; Rajagopalan, Satish ; Batterywala, Shabbir H.

  • Author_Institution
    RMZ Infinity, Synopsys India Pvt. Ltd., Bangalore, India
  • fYear
    2014
  • fDate
    20-23 Jan. 2014
  • Firstpage
    149
  • Lastpage
    154
  • Abstract
    Double Patterning Technology (DPT) conflicts express themselves as odd cycles of spacing between layout shapes. One way of resolving these is by imposing a large spacing constraint between a pair of shapes participant in an odd cycle. However, this may shrink spacing in other parts of the layout and introduce DRC violations or new DPT conflicts. In this work, we model DPT conflict resolution as a constrained linear optimization problem, look ahead to upfront estimate potential violations and preclude them with additional constraints. We borrow the approach of Satisfiability Modulo Theory (SMT) solvers to simultaneously check satisfiability of linear constraint set and resolution of DPT conflicts. These two are interleaved and feed information to each other to churn out a feasible set of constraints that fixes DPT and DRC violations. We demonstrate the efficacy of the method on layouts at advanced nodes.
  • Keywords
    computability; linear programming; masks; photolithography; DPT conflict resolution; SMT solvers; constrained linear optimization problem; double patterning technology; fixing double patterning violations; large spacing constraint; layout shapes; linear constraint set; lithography; satisfiability modulo theory; Context; Engines; Geometry; Image edge detection; Layout; Shape; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (ASP-DAC), 2014 19th Asia and South Pacific
  • Conference_Location
    Singapore
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2014.6742881
  • Filename
    6742881