DocumentCode
245287
Title
Fixing Double Patterning violations with look-ahead
Author
Bhattacharya, Surya ; Rajagopalan, Satish ; Batterywala, Shabbir H.
Author_Institution
RMZ Infinity, Synopsys India Pvt. Ltd., Bangalore, India
fYear
2014
fDate
20-23 Jan. 2014
Firstpage
149
Lastpage
154
Abstract
Double Patterning Technology (DPT) conflicts express themselves as odd cycles of spacing between layout shapes. One way of resolving these is by imposing a large spacing constraint between a pair of shapes participant in an odd cycle. However, this may shrink spacing in other parts of the layout and introduce DRC violations or new DPT conflicts. In this work, we model DPT conflict resolution as a constrained linear optimization problem, look ahead to upfront estimate potential violations and preclude them with additional constraints. We borrow the approach of Satisfiability Modulo Theory (SMT) solvers to simultaneously check satisfiability of linear constraint set and resolution of DPT conflicts. These two are interleaved and feed information to each other to churn out a feasible set of constraints that fixes DPT and DRC violations. We demonstrate the efficacy of the method on layouts at advanced nodes.
Keywords
computability; linear programming; masks; photolithography; DPT conflict resolution; SMT solvers; constrained linear optimization problem; double patterning technology; fixing double patterning violations; large spacing constraint; layout shapes; linear constraint set; lithography; satisfiability modulo theory; Context; Engines; Geometry; Image edge detection; Layout; Shape; Vectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference (ASP-DAC), 2014 19th Asia and South Pacific
Conference_Location
Singapore
Type
conf
DOI
10.1109/ASPDAC.2014.6742881
Filename
6742881
Link To Document