Title :
A benchmark suite for evaluating the efficiency of test tools
Author :
Kruus, H. ; Ubar, R. ; Ellervee, P. ; Gorev, M. ; Pesonen, V. ; Devadze, S. ; Orasson, E. ; Brik, M. ; Min, M. ; Annus, P. ; Kruus, M. ; Meigas, K.
Author_Institution :
TTU, Tallinn, Estonia
Abstract :
We propose a benchmark suite for systematic evaluation of efficiency of new CAD and test algorithms. The suite consists of a set of high performance signal processors. Differently from all other existing benchmark suites, all the member processors of this family perform the same function, but are implemented in different ways, differing mainly in sharing of computing resources. The circuits are characterized by different structural complexities measured in the number of reconvergent fan-outs. The latter feature has the main impact to the testability of circuits, influencing directly on the efficiency of test tools and on the quality of the given test set. The main advantage of the benchmark suite, compared to the existing ones, relies in the possibility to create systematic dependencies of the efficiency of test algorithms or test quality as a function of the structural complexity of circuits.
Keywords :
benchmark testing; circuit CAD; circuit complexity; digital signal processing chips; integrated circuit testing; performance evaluation; CAD; benchmark suite; circuit characterization; circuit testability; computing resource sharing; high performance signal processors; reconvergent fan-outs; structural complexity; systematic efficiency evaluation; test algorithms; test tool efficiency evaluation; Benchmark testing; Bioimpedance; Biomedical measurements; Built-in self-test; Circuit faults; Design automation; Program processors;
Conference_Titel :
Electronics Conference (BEC), 2012 13th Biennial Baltic
Conference_Location :
Tallinn
Print_ISBN :
978-1-4673-2775-6
DOI :
10.1109/BEC.2012.6376821