• DocumentCode
    245319
  • Title

    Prediction of the BCI results For CAN bus ECU using incident wave excitation method

  • Author

    Wei Ting Lee ; Yung Chi Chung ; Chu Yu Chen ; Jing Jou Tang ; Chung Shun Yang

  • Author_Institution
    Dept. of Electr. Eng., Nat. Univ. of Tainan, Tainan, Taiwan
  • fYear
    2014
  • fDate
    26-28 May 2014
  • Firstpage
    175
  • Lastpage
    176
  • Abstract
    In this paper, a method called the incident wave excitation method is proposed to incorporate the effects of the coupling noise onto leads of the CAN bus. The equivalent circuit model for two wires (CAN high line and CAN low line) system is firstly derived. The distributed voltage and current sources along the lead excited by the coupling noise can be computed. The set up for the ISO bulk-current injection (BCI) measurement at the IC level is performed. The computed results will be further verified and compared with BCI specific experimental results.
  • Keywords
    controller area networks; equivalent circuits; BCI measurement; CAN bus; CAN high line system; CAN low line system; ECU; IC level; bulk-current injection; coupling noise; distributed current sources; distributed voltage sources; equivalent circuit model; incident wave excitation method; Couplings; Current measurement; Frequency measurement; Integrated circuit modeling; Noise; Voltage measurement; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Consumer Electronics - Taiwan (ICCE-TW), 2014 IEEE International Conference on
  • Conference_Location
    Taipei
  • Type

    conf

  • DOI
    10.1109/ICCE-TW.2014.6904045
  • Filename
    6904045