DocumentCode
2453291
Title
Multi-Class Classification Using a New Sigmoid Loss Function for Minimum Classification Error (MCE)
Author
Ratnagiri, M.V. ; Rabiner, L. ; Biing-Hwang Juang
Author_Institution
Dept. of Electr. & Comput. Eng., Rutgers Univ., Piscataway, NJ, USA
fYear
2010
fDate
12-14 Dec. 2010
Firstpage
84
Lastpage
89
Abstract
A new loss function has been introduced for Minimum Classification Error, that approaches optimal Bayes´ risk and also gives an improvement in performance over standard MCE systems when evaluated on the Aurora connected digits database.
Keywords
Bayes methods; pattern classification; Aurora connected digits database; minimum classification error; multi-class classification; optimal Bayes risk and; sigmoid loss function; Accuracy; Databases; Estimation; Hidden Markov models; Kernel; Loss measurement; Noise; Bayes Risk; Minimum Classification Error; Savage Loss; sigmoid loss;
fLanguage
English
Publisher
ieee
Conference_Titel
Machine Learning and Applications (ICMLA), 2010 Ninth International Conference on
Conference_Location
Washington, DC
Print_ISBN
978-1-4244-9211-4
Type
conf
DOI
10.1109/ICMLA.2010.20
Filename
5708817
Link To Document