• DocumentCode
    2456735
  • Title

    An electrical current flow technology for the next generation of automated testing equipment

  • Author

    Fitzgibbon, Kevin ; Kirkland, Larry ; Flann, Nicholas ; Wilson, Nathan

  • fYear
    2002
  • fDate
    2002
  • Firstpage
    745
  • Lastpage
    760
  • Abstract
    This paper presents a technology to measure and analyze electrical current (EC) flow in units-under-test (UUT). The paper discusses the results of preliminary investigations and high-level design specifications that will lead to the development of a prototype to demonstrate the concepts and the benefits of using EC data and information. Non-intrusive and intrusive sensor technology, and experimental results are presented. The characteristics and benefits of each sensor and technology are discussed. EC measurements are characterized by collection and domain types, and include time-domain signatures and single/multiple signals, and frequency-domain power spectral density (PSD) functions. EC data is then applied to neural network (NN) algorithms to provide pass/fail test results. The paper discusses NN methods of learning and processing for the different classes of signals. The methods and technologies discussed here introduce a valuable capability for test equipment operators, repair technicians, and test software engineers in the next generation of automated testing equipment (ATE).
  • Keywords
    automatic test equipment; electric current measurement; electric sensing devices; neural nets; automated testing equipment; electrical current flow technology; frequency domain; high-level design; intrusive sensor; neural network algorithm; nonintrusive sensor; power spectral density; time domain; Automatic testing; Current measurement; Density measurement; Electric variables measurement; Fluid flow measurement; Neural networks; Power measurement; Prototypes; Sensor phenomena and characterization; Software testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON Proceedings, 2002. IEEE
  • ISSN
    1080-7725
  • Print_ISBN
    0-7803-7441-X
  • Type

    conf

  • DOI
    10.1109/AUTEST.2002.1047956
  • Filename
    1047956